In the recent years, the proposer collaborated with other researchers on the following research questions: If a single comparator in an Odd-Even Transposition sorting network is stuck-at-X, is the sorting network fault tolerant? Fault tolerant means that the network sorts correctly in the presence of a fault. By writing a program to stimulate the operation of the Odd-Even Transposition sorting network, we discovered that if a comparator is stuck-at-X in the interior of the network, the network is fault tolerant, and we also discovered that if any two or three comparators in a slightly smaller interior region of the network are stuck-at-X, the network is also fault-tolerant [1-2].
The objectives of this research project are to analyze the fault tolerance properties with respect to stuck-at-X faults in the Odd-Even and Batcher’s Bitonic sorting networks under the mode of operation of multiple passes. Also, computing or estimating the number of passes needed to achieve a high fault tolerant condition.